# Package org.eclipse.microprofile.fault.tolerance.tck.config

Class Summary
BeanWithRetry
BulkheadConfigBean: A suite of test methods to test the parameters of bulkhead
BulkheadConfigTest: Test that the parameters of Bulkhead can be configured
CircuitBreakerConfigBean: Suite of methods for testing the various parameters of CircuitBreaker
CircuitBreakerConfigTest: Test configuration of parameters of `CircuitBreaker`
CircuitBreakerSkipOnConfigTest: Test configuring CircuitBreaker.skipOn globally
ConfigAnnotationAsset
ConfigPropertyGlobalVsClassTest
ConfigPropertyGlobalVsClassVsMethodTest
ConfigPropertyOnClassAndMethodTest
FallbackApplyOnConfigTest: Test configuring Fallback.applyOn globally
FallbackConfigBean: Bean with methods to help test configuration of parameters of `Fallback`
FallbackConfigTest: Test configuration of parameters of `Fallback`
FallbackHandlerA
FallbackHandlerB
FallbackSkipOnConfigTest: Test configuring Fallback.skipOn globally
RetryConfigBean: Suite of methods for testing the various parameters of Retry
RetryConfigTest: Test that the various parameters of Retry can be configured
TimeoutConfigBean: Suite of methods for testing the various parameters of Timeout
TimeoutConfigTest: Test that the various parameters of Timeout can be configured

Exception Summary
TestConfigExceptionA: Exception for config tests
TestConfigExceptionB
TestConfigExceptionB1